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.020 OR LARGER

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Solutions

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LED & LCD Test Solutions

APS pins are being successfully used in LED wafer test as well as in subsequent test applications throughout the globe.  Let APS’s expertise and experience help you solve your LED or LCD test challenge.  

LED Wafer Test

APS pins in small diameters and a variety of materials are the answer to the challenge of testing gold bumps and pads without damage to the gold surface in LED wafer test situations.  Gold bumps require special care during wafer test to avoid damage.  APS probes in the most suitable material and small diameters of .003-.004” have been used successfully in this challenging test situation.  The quality of pins provided by APS for LED wafer test is unsurpassed.

LED and LCD Subsequent Test

Subsequent testing in LED and LCD situations requires probes that are very different than those used in wafer test.  The requirement for low contact resistance and the requirement to avoid damage to the surface being tested require a careful selection of material.  Another difference is the larger diameters and rounded tips of these pins.  APS pins in various materials have set the standard for LED and LCD testing post wafer.  The quality and integrity of the material as well as APS’s quality production methods can guarantee your success in this test arena.

Let APS assist you in developing the optimal solution for your LED and LCD test situations.  Our experience is these areas can work to your advantage.

Palladium Alloy &
Beryllium-Copper

Pins in these materials are provided in diameters from .003’-.020” and are suitable for a variety of test and industrial applications.

Wafer Sort
and Testing

Advanced Probing Systems manufactures probes suitable for cantilever wafer test.

Solid Pins in .020"
Diameters or Larger

APS’s capabilities to produce pins in diameters of .020” or larger for a variety of test and industrial applications.

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Request a Quote

Request a quote directly from APS. For additional information see the ordering information link.