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NewTek™ Probes, Pins, and Needles

NewTek™ is available only from Advanced Probing Systems

NewTek™ is Advanced Probing Systems, Inc.’s proprietary, non-oxidizing probe needle material.  The properties of NTK allow it to maintain low and stable contact resistance during wafer test with minimal cleaning even at high temperature testing. NewTek has been successfully used in low-K testing, to test pads with thin aluminum over copper, in test situations where multiple touchdowns are required as well as numerous other test applications. NewTek probes may be the optimal choice in situations where minimal pad damage is essential.

NewTek is available in standard pin diameters and lengths used in cantilever test applications as well as in the smaller diameters more typical of buckling beam vertical technologies.

NewTek™ is now available in .020" diameter pins.

Pin Information References:

• NewTek™ Press Release Download (~360k)

• "Maximizing the Performance of An Atypical Cantilever Probe Wire Material” – Presentation by Frederick Taber to the 2006 Southwest Test Workshop” should also be included on this page. Download a pdf of this Powerpoint presentation (~360k)

• "Low and Stable Contact Resistance with Reduced Cleaning, a Paradigm Shift" – Presented by Jerry Broz and Rey Rincon at the 1999. www.swtest.org (opens in new window)

• “Understanding Probe-Contact a-Spot Oxidation During Elevated-Temperature Wafer Test” by Jerry Broz and Rey Rincon – Evaluation Engineering September 1999 (Copies are available upon request from APS)

• “Probe Contact Resistance Variations during Elevated Temperature Wafer Test” by Jerry Broz and Rey Rincon – presented at the 1999 International Test Conference. Copies are available at www.ieee.org (Membership and a small fee are required to access article

Call 800.631.0005 for a consultation or price quote or click here.

NewTek™ as a Probe Material   Pin Performance Lower –––––––––––––––––– Higher Cres (*) Vickers Hardness Tensile Strength Elastic Modulus Not to Scale Paliney BeCu NewTek W/Wr Maximizing the performance of cantilever probe wire material

NewTek™ Wafer Sort

• low and stable contact resistance
• non-oxidizing pin
• minimal pad damage
• high temperature test
• cantilever test applications

Palladium Alloy &
Beryllium-Copper

Pins in these materials are provided in diameters from .003’-.020” and are suitable for a variety of test and industrial applications.

Wafer Sort
and Testing

Advanced Probing Systems manufactures probes suitable for cantilever wafer test.

Solid Pins in 0.20"
Diametersor Larger

APS’s capabilities to produce pins in diameters of .020” or larger for a variety of test and industrial applications.

Click Here to
Request a Quote

Request a quote directly from APS. For additional information see the ordering information link.