(click to enlarge)
- Revolutionary
- Non-oxidizing
- Available in standard diameters and lengths
NewTek™
NTK™ is available only from Advanced Probing Systems, Inc.
NewTek™, Advanced Probing Systems, Inc.’s proprietary probe needle material, maintains low and stable contact resistance during wafer test. NewTek™ (“NTK”) has been shown to demonstrate low and stable contact resistance during wafer test with minimal cleaning even at high temperature testing. NTK™has been successfully used in low-K testing, to test pads with thin aluminum over copper, in test situations where multiple touchdowns are required as well as numerous other test applications. NTK™ is available in standard diameters and lengths used in cantilever test applications as well as in the smaller diameters more typical of buckling beam vertical technologies.
NewTek™ is now available in .020" diameter pins.
REFERENCES:
- NewTek™ Press Release Download (~360k)
- "Maximizing the Performance of An Atypical Cantilever Probe Wire Material” – Presentation by Frederick Taber to the 2006 Southwest Test Workshop” should also be included on this page. Download a pdf of this Powerpoint presentation (~360k)
- "Low and Stable Contact Resistance with Reduced Cleaning, a Paradigm Shift" – Presented by Jerry Broz and Rey Rincon at the 1999. www.swtest.org (opens in new window)
- “Understanding Probe-Contact a-Spot Oxidation During Elevated-Temperature Wafer Test” by Jerry Broz and Rey Rincon – Evaluation Engineering September 1999 (Copies are available upon request from APS)
- “Probe Contact Resistance Variations during Elevated Temperature Wafer Test” by Jerry Broz and Rey Rincon – presented at the 1999 International Test Conference. Copies are available at www.ieee.org (Membership and a small fee are required to access article.)
