Pins in these materials are provided in diameters from .003"-.020” and are suitable for a variety of test and industrial applications.
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Advanced Probing Systems manufactures probes suitable for cantilever wafer test.
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APS’s capabilities to produce pins in diameters of .020” or larger for a variety of test and industrial applications.
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Request a quote directly from APS. For additional information see the ordering information link.
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